Application of VXI bus technology in ATE for space net-load

SUN Wen-tao; ZHAI Lin-pei

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Application of VXI bus technology in ATE for space net-load

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- Application of VXI bus technology in ATE for space net-load
- Optics and Precision Engineering Vol. 10, Issue 4, Pages: 425-428(2002)
- 作者机构：
  
  中国科学院长春光学精密机械与物理研究所,吉林长春,130022
- 作者简介：
- 基金信息：
- DOI：
  CLC： TP206
- Received：09 June 2001，
  
  Revised：22 April 2002，
  
  Published Online：15 August 2002，
  
  Published：15 August 2002
- 稿件说明：
移动端阅览
孙文涛, 翟林培. VXI总线技术在空间有效载荷自动测试设备中的应用[J]. 光学精密工程, 2002,(4): 425-428

SUN Wen-tao, ZHAI Lin-pei. Application of VXI bus technology in ATE for space net-load[J]. Editorial Office of Optics and Precision Engineering, 2002,(4): 425-428
孙文涛, 翟林培. VXI总线技术在空间有效载荷自动测试设备中的应用[J]. 光学精密工程, 2002,(4): 425-428 DOI：

SUN Wen-tao, ZHAI Lin-pei. Application of VXI bus technology in ATE for space net-load[J]. Editorial Office of Optics and Precision Engineering, 2002,(4): 425-428 DOI：

摘要

采用VXI总线技术组建的自动测试设备包括智能接口、由VXI总线模块仪器组成的数据采集系统和以VEE为开发环境的自动测试软件.智能接口成功地解决了对测试对象提供的检测信号的相互隔离;VXI总线模块仪器的使用大大地提高了整个自动测试设备的硬件可靠性;使用VEE开发自动测试软件

降低了软件开发的复杂程度

缩短了开发周期

保证了自动测试软件可靠性.这套自动测试设备实现了对空间有效载荷的在线自动测试

为检验空间有效载荷的功能提供了可靠的依据.

Abstract

This set of ATE(Auto Test Equipment) based on VXI bus technology includes an intelligent interface

a data acquisition system of VXI bus module devices and an auto test software developed via VEE. The intelligent interface isolates the test signals provided by DUT(device under test) successfully. The use of VXI bus module devices improves the ATE hardware reliability

while the use of VEE reduces the software development complexity

shortens its period and keeps the auto test software in guarantee. This set of ATE accomplishes online measurement and test for the space net-load automatically

and provides various reliable data to test the functions of the space net-load.

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Keywords

references

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