浏览全部资源
扫码关注微信
1.中国科学院 微电子研究所,北京 100029
2.中国科学院大学,北京 100049
Received:17 December 2024,
Revised:24 January 2025,
Published:10 May 2025
移动端阅览
赵天元,董登峰,王国名等.Micro LED表面缺陷的快速高精度检测[J].光学精密工程,2025,33(09):1434-1445.
ZHAO Tianyuan,DONG Dengfeng,WANG Guoming,et al.Rapid and high-precision detection on surface defects of Micro LED[J].Optics and Precision Engineering,2025,33(09):1434-1445.
赵天元,董登峰,王国名等.Micro LED表面缺陷的快速高精度检测[J].光学精密工程,2025,33(09):1434-1445. DOI: 10.37188/OPE.20253309.1434. CSTR: 32169.14.OPE.20253309.1434.
ZHAO Tianyuan,DONG Dengfeng,WANG Guoming,et al.Rapid and high-precision detection on surface defects of Micro LED[J].Optics and Precision Engineering,2025,33(09):1434-1445. DOI: 10.37188/OPE.20253309.1434. CSTR: 32169.14.OPE.20253309.1434.
0
Views
9
下载量
CSCD
Publicity Resources
Related Articles
Related Author
Related Institution