Optimization design of combined brightfield and darkfield illumination system for machine vision measurement
Modern Applied Optics|更新时间:2025-12-02
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Optimization design of combined brightfield and darkfield illumination system for machine vision measurement
“In the field of machine vision measurement, experts have established an illuminance distribution model for a compound lighting system with bright and dark fields. Improved algorithms are used to optimize the arrangement of light sources, effectively improving the uniformity of illumination in the target area.”
Optics and Precision EngineeringVol. 33, Issue 20, Pages: 3203-3213(2025)
HAO Fei,GU Zhipeng,GUAN Hongyao,et al.Optimization design of combined brightfield and darkfield illumination system for machine vision measurement[J].Optics and Precision Engineering,2025,33(20):3203-3213.
HAO Fei,GU Zhipeng,GUAN Hongyao,et al.Optimization design of combined brightfield and darkfield illumination system for machine vision measurement[J].Optics and Precision Engineering,2025,33(20):3203-3213. DOI: 10.37188/OPE.20253320.3203. CSTR: 32169.14.OPE.20253320.3203.
Optimization design of combined brightfield and darkfield illumination system for machine vision measurement