是通过测量光电离子流得出光谱辐射强度.并详细介绍我们研制1米软 X 射线稀有气体电离室的工作原理及结构
测出空阴极光源辐射出的HeⅡ25.6nm 离子线及 Henke 光源辐射出的
CK
α
4.47nm 线的强度随电离室工作气压的变化
外推出零气压下谱线光谱辐射强度
最终得出谱线的绝对光谱辐射强度.
Abstract
The technique of soft X-ray ion chamber includes the measure-ment of the ion current as a function of rare gas pressure in the ion chamber.The true photoionization current
and hence absolute photon flux
is obtained by extrapolating ion current to zero gas pressure. This paper describes measurement of the absolute photon flux at He Ⅱ25.6nm and CK