LIANG Yan, LIU Wen-yao. Fast orthogonal edge projection algorithm for inspection of film defects[J]. Editorial Office of Optics and Precision Engineering, 2004,(3): 323-329
LIANG Yan, LIU Wen-yao. Fast orthogonal edge projection algorithm for inspection of film defects[J]. Editorial Office of Optics and Precision Engineering, 2004,(3): 323-329DOI:
A fast orthogonal edge projection algorithm is proposed for real-time inspection of film defects on production line. By analyzing the characteristics of infrared images of film
using image-processing techniques including neighborhood averaging
edge detection and projection method
etc.
and compiling the VC++ program film defects are quickly identified. In this process
the key is the projection method that transforms two-dimension images into two one-dimension vectors. Furthermore
new functions
such as evaluation of defect area and severity can be added to the algorithm in accordance with the actual requirements. On-line experiments in Lucky Film Corp. proved that the algorithm can detect all kinds of film defects and process a 659+494 image within 20 ms.
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references
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