Discussing the Principle and the Method of Examining Optical Accurate Elements

Chen Peiren

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Discussing the Principle and the Method of Examining Optical Accurate Elements

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- Discussing the Principle and the Method of Examining Optical Accurate Elements
- Optics and Precision Engineering Vol. 0, Issue 1, Pages: 27-33(1986)
- 作者机构：
  
  海军第二炮兵学院
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published Online：15 February 1986，
  
  Published：15 February 1986
- 稿件说明：
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陈培仁. 光学精加工检验原理及方法讨论[J]. 光学精密工程, 1986,(1): 27-33

Chen Peiren. Discussing the Principle and the Method of Examining Optical Accurate Elements[J]. Editorial Office of Optics and Precision Engineering, 1986,(1): 27-33
陈培仁. 光学精加工检验原理及方法讨论[J]. 光学精密工程, 1986,(1): 27-33 DOI：

Chen Peiren. Discussing the Principle and the Method of Examining Optical Accurate Elements[J]. Editorial Office of Optics and Precision Engineering, 1986,(1): 27-33 DOI：

摘要

应用等厚干涉对精加工光学零件进行检验在偏差小于四分之一波长时遇到困难。本文通过复色光干涉色的分析定量建立了干涉色与偏差之间的关系

论证了光学精加工检验原理并提出了具体的检验方法。这将有助于提高和保证光电制导、军事摄影、遥感、测距等技术领域对光学零件加工精度所提出的越来越高的要求。

Abstract

It is a difficult problem to examine optical accurate elements by means of isothick interference with a tolerance of less than one fourth of a wavelength. This article establishes the relations between interference colours and tolerance from a quantitative analysis

proves the principle of examining optical accurate elements and advances specific examining methods. These can improve and pledge to the higher quality requirements which is advanced by the fields of the photoelectric guidance systems

military

photography

remote sensing

range finding and so on

as processing optical accurate elements.

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