A New Method for Determining Optical Parameters of Nonabsorbing Thin Film

Qian Longsheng; Li Xiuyu; Yuan Youxin

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A New Method for Determining Optical Parameters of Nonabsorbing Thin Film

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- A New Method for Determining Optical Parameters of Nonabsorbing Thin Film
- Optics and Precision Engineering Vol. 0, Issue 3, Pages: 7-18(1986)
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- Published Online：15 June 1986，
  
  Published：15 June 1986
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钱龙生, 李秀玉, 袁幼心. 确定无吸收薄膜光学参数的新方法[J]. 光学精密工程, 1986,(3): 7-18

Qian Longsheng, Li Xiuyu, Yuan Youxin. A New Method for Determining Optical Parameters of Nonabsorbing Thin Film[J]. Editorial Office of Optics and Precision Engineering, 1986,(3): 7-18
钱龙生, 李秀玉, 袁幼心. 确定无吸收薄膜光学参数的新方法[J]. 光学精密工程, 1986,(3): 7-18 DOI：

Qian Longsheng, Li Xiuyu, Yuan Youxin. A New Method for Determining Optical Parameters of Nonabsorbing Thin Film[J]. Editorial Office of Optics and Precision Engineering, 1986,(3): 7-18 DOI：

摘要

本文提出一种测量无吸收单层膜光学参数的新方法

它利用 T—λ曲线上的特定光学位相点求出单层膜的几何厚度

进而求出色散因子。

Abstract

A new method for measuring optical paranleters of nonabsorbing siagle lager of thin film is given in this paper.The method determines the geometry thickuess of the film in terms of special optical phase at T～λ

curve

and every parameters of olispersion.

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