Determination of Thickness and Index of Corrosive Layers on Glass Surfaces

Duan Huifen; Xie Ying

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Determination of Thickness and Index of Corrosive Layers on Glass Surfaces

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- Determination of Thickness and Index of Corrosive Layers on Glass Surfaces
- Optics and Precision Engineering Vol. 0, Issue 6, Pages: 25-30(1986)
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- Published Online：15 December 1986，
  
  Published：15 December 1986
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段惠芬, 解颖. 玻璃表面侵蚀层厚度和折射率的测定[J]. 光学精密工程, 1986,(6): 25-30

Duan Huifen, Xie Ying. Determination of Thickness and Index of Corrosive Layers on Glass Surfaces[J]. Editorial Office of Optics and Precision Engineering, 1986,(6): 25-30
段惠芬, 解颖. 玻璃表面侵蚀层厚度和折射率的测定[J]. 光学精密工程, 1986,(6): 25-30 DOI：

Duan Huifen, Xie Ying. Determination of Thickness and Index of Corrosive Layers on Glass Surfaces[J]. Editorial Office of Optics and Precision Engineering, 1986,(6): 25-30 DOI：

摘要

本文叙述了偏光法测量薄膜厚度和折射率的原理及它在玻璃表面物理化学性质测试中的应用。

Abstract

This paper describes the principle of the polarimetric method for determining the thickness and index of thin films. The method has been applied to measure the physical chemistry properties of glass surfaces.

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Determination of Thickness and Index of Corrosive Layers on Glass Surfaces

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摘要

Abstract

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Keywords

references