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中国科学院上海光机所
Published Online:15 April 1988,
Published:15 April 1988
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李锡善, 许世忠. 光盘衬底光学性能测试[J]. 光学精密工程, 1988,(2): 35-46
Li Xishan, Xu Shizhong. Measurement of properties of Optical Disc Substrate[J]. Editorial Office of Optics and Precision Engineering, 1988,(2): 35-46
李锡善, 许世忠. 光盘衬底光学性能测试[J]. 光学精密工程, 1988,(2): 35-46 DOI:
Li Xishan, Xu Shizhong. Measurement of properties of Optical Disc Substrate[J]. Editorial Office of Optics and Precision Engineering, 1988,(2): 35-46 DOI:
本文讨论了不同光盘衬底材料的基本性能及基片的缺陷密度、粗糙度和平整度等参数测量方法.
This paper discusses material properties of the optical disc substrate and measurement methods of the defect density
roughness and planeness.
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