An Intelligent Curve Tracer for Semiconductor Properpies

Gao Weizhi

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An Intelligent Curve Tracer for Semiconductor Properpies

更新时间：2020-08-13

- An Intelligent Curve Tracer for Semiconductor Properpies
- Optics and Precision Engineering Vol. 0, Issue 3, Pages: 67-69(1988)
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- Published Online：15 June 1988，
  
  Published：15 June 1988
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高伟志. 智能半导体特性曲线图示仪[J]. 光学精密工程, 1988,(3): 67-69

Gao Weizhi. An Intelligent Curve Tracer for Semiconductor Properpies[J]. Editorial Office of Optics and Precision Engineering, 1988,(3): 67-69
高伟志. 智能半导体特性曲线图示仪[J]. 光学精密工程, 1988,(3): 67-69 DOI：

Gao Weizhi. An Intelligent Curve Tracer for Semiconductor Properpies[J]. Editorial Office of Optics and Precision Engineering, 1988,(3): 67-69 DOI：

摘要

智能半导体特性曲线图示仪用于自动测试晶体管特性曲线.它采用了单片微型机8031为中央控制器

其功能齐全

是电子仪器领域中的新一代产品.本文概略地描述了此系统的功能、硬件和软件的设计.

Abstract

An intelligent curve tracer for semiconductor properies is applied to test semicondctor devices automatically. The system adoptes a single chip microcomputer 8031 as central controller.It is a new product with lots of functions in the range of new generation electronic instrumentation. This paper describes designs of hardware and software for the intelligent curve tracer for semiconductor properies briefly.

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