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Differential Interferential Microprocessor-based Measurement System for Precision Measuring the Radius of Curvature of Long Radius Concave Optical Surfaces
更新时间:2020-08-12
    • Differential Interferential Microprocessor-based Measurement System for Precision Measuring the Radius of Curvature of Long Radius Concave Optical Surfaces

    • Optics and Precision Engineering   Vol. 2, Issue 6, Pages: 97-102(1994)
    • Received:10 August 1994

      Published Online:15 December 1994

      Published:15 December 1994

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  • Shi Xiurong, Zhang Xingye. Differential Interferential Microprocessor-based Measurement System for Precision Measuring the Radius of Curvature of Long Radius Concave Optical Surfaces[J]. Editorial Office of Optics and Precision Engineering, 1994,(6): 97-102 DOI:

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