A Study of Charge-Coupled-Device MTF Testing Method

Li Wei

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A Study of Charge-Coupled-Device MTF Testing Method

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- A Study of Charge-Coupled-Device MTF Testing Method
- Optics and Precision Engineering Vol. 1, Issue 5, Pages: 146-148(1993)
- 作者机构：
  
  中国科学院长春光学精密机械研究所, 长春, 130022
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：20 November 1993，
  
  Published Online：15 October 1993，
  
  Published：15 October 1993
- 稿件说明：
移动端阅览
李炜. 电荷耦合器件调制传递函数测试方法的研究[J]. 光学精密工程, 1993,(5): 146-148

Li Wei. A Study of Charge-Coupled-Device MTF Testing Method[J]. Editorial Office of Optics and Precision Engineering, 1993,(5): 146-148
李炜. 电荷耦合器件调制传递函数测试方法的研究[J]. 光学精密工程, 1993,(5): 146-148 DOI：

Li Wei. A Study of Charge-Coupled-Device MTF Testing Method[J]. Editorial Office of Optics and Precision Engineering, 1993,(5): 146-148 DOI：

摘要

本文在理论上系统阐述了用调制传递函数方法评价电荷耦合器件性能的可行性

分析讨论了电荷耦合器件调制传递函数的构成

系统研究了电荷耦合器件调制传递函数的测试方法。本文提出了测量方案

并详细介绍了系统的构成及软件设计

最后给出了测量结果。

Abstract

This paper analysises and discusses the probability to evaluate the character of CCD by the concept of MTF in theory

and gives the requirement to evaluate CCD by MTF; then this paper carefully discusses the method to evaluate the MTF of CCD

and gives the testing methol; in the end

this paper gives the testing result and conclusion.

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