Ways to Improve Operating Characteristics of MCP

Guo Hongchang; Jiang Delong; Wu Kui

doi:null

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Ways to Improve Operating Characteristics of MCP

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- Ways to Improve Operating Characteristics of MCP
- Optics and Precision Engineering Vol. 2, Issue 3, Pages: 62-65(1994)
- 作者机构：
  
  1. 通化师范学院物理系, 通化 1340022
  2. 长春光机学院现代光学所长春,130022
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：03 April 1994，
  
  Published Online：15 June 1994，
  
  Published：15 June 1994
- 稿件说明：
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郭洪昌, 姜德龙, 吴奎. 改善MCP工作特性的途径[J]. 光学精密工程, 1994,(3): 62-65

Guo Hongchang, Jiang Delong, Wu Kui. Ways to Improve Operating Characteristics of MCP[J]. Editorial Office of Optics and Precision Engineering, 1994,(3): 62-65
郭洪昌, 姜德龙, 吴奎. 改善MCP工作特性的途径[J]. 光学精密工程, 1994,(3): 62-65 DOI：

Guo Hongchang, Jiang Delong, Wu Kui. Ways to Improve Operating Characteristics of MCP[J]. Editorial Office of Optics and Precision Engineering, 1994,(3): 62-65 DOI：

摘要

通过降低MCP的噪声、减少正离子反馈和扩大动态范围

提出了改善器件电子成像特性和提高探测能力的途径。文中给出了一些实验结果

进行了具体分析。

Abstract

In this paper

we report and review some technical ways to further improve the characteristic of electron image and to increase the detecting ablilty of devices through lowering thenoise of MCP

decreasing the feedback of positive ions and broadening the dynamic ranges.Recent experimental results are shown and necessary analysis is made.

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