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长春大学电子工程学院 长春,130022
Received:20 January 1995,
Published Online:15 April 1995,
Published:15 April 1995
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魏燎原, 吴显祥. 探测平面互强度的性质[J]. 光学精密工程, 1995,(2): 25-28
Wei Liaoyuan, Wu Xianxiang. Properties of Probe plane Mutual Intensity[J]. Editorial Office of Optics and Precision Engineering, 1995,(2): 25-28
魏燎原, 吴显祥. 探测平面互强度的性质[J]. 光学精密工程, 1995,(2): 25-28 DOI:
Wei Liaoyuan, Wu Xianxiang. Properties of Probe plane Mutual Intensity[J]. Editorial Office of Optics and Precision Engineering, 1995,(2): 25-28 DOI:
本文研究探测平面的互强度与散射表面性质的关系
最后就其结果进行了讨论。
This paper researched the relation between probe plane mutual intensity and scattering surface. Finally
the results are well discussed.
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