Research on Techniques of Alignment and Measurement about Infrared Interferometer

Huang Shenwang; Chen Lei; Chen Jinbang; Jin Guoyou

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Research on Techniques of Alignment and Measurement about Infrared Interferometer

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- Research on Techniques of Alignment and Measurement about Infrared Interferometer
- Optics and Precision Engineering Vol. 4, Issue 2, Pages: 98-102(1996)
- 作者机构：
  
  南京理工大学电光分院南京,210094
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：26 September 1995，
  
  Published Online：15 April 1996，
  
  Published：15 April 1996
- 稿件说明：
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黄深旺, 陈磊, 陈进榜, 金国佑. 红外干涉仪调试和测量技术的研究[J]. 光学精密工程, 1996,(2): 98-102

Huang Shenwang, Chen Lei, Chen Jinbang, Jin Guoyou. Research on Techniques of Alignment and Measurement about Infrared Interferometer[J]. Editorial Office of Optics and Precision Engineering, 1996,(2): 98-102
黄深旺, 陈磊, 陈进榜, 金国佑. 红外干涉仪调试和测量技术的研究[J]. 光学精密工程, 1996,(2): 98-102 DOI：

Huang Shenwang, Chen Lei, Chen Jinbang, Jin Guoyou. Research on Techniques of Alignment and Measurement about Infrared Interferometer[J]. Editorial Office of Optics and Precision Engineering, 1996,(2): 98-102 DOI：

摘要

从干涉计量术方面对自行研制的移相式CO

红外激光干涉仪进行了研究并提供了精确定位红外光路的调试技术

应用该干涉仪对红外光学元件及系统进行了测量;最后

对本干涉仪的系统误差作了测试和分析.结果表明

本仪器系统误差优于λ/20(λ=10.6μm).

Abstract

This paper does some researches on the self-developed phase-shifting CO

infrared interferometer from the aspect of interferometry

and provides a technique which is used to aligninfrared interferometer precisely. Measurements of infrared components and systems are taken on this infrared interferometer. Finally

the system error of the infrared interferometer ismeasured and analysed

which is better than A/20(λ=10.6μm)as shown in results.

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Related Institution

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南京理工大学电子工程与光电技术学院

中国兵器工业集团南京北方信息产业集团2. 南京理工大学电子工程与光电技术学院

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