您当前的位置：
首页 >
文章列表页 >
The Method of Micro tiny Displacement Measurement by Dimension Reduction
更新时间：2020-08-12

    • The Method of Micro tiny Displacement Measurement by Dimension Reduction

    • Optics and Precision Engineering   Vol. 6, Issue 2, Pages: 115-119(1998)

    • Received：26 September 1997，

      Revised：14 January 1998，

      Published Online：15 April 1998，

      Published：15 April 1998

    移动端阅览

  • HE Geng-Xian . The Method of Micro tiny Displacement Measurement by Dimension Reduction[J]. Editorial Office of Optics and Precision Engineering, 1998,(2): 115-119 DOI：

  •  
  •  

0

Views

648

下载量

0

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Digital binning method for CCD pixels and its applications
Design of ultra-high resolution CCD imaging systems
High-speed CCD image data fiber transmission system
The CCD,ICCD and IRCCD as Imager
A Study of Charge-Coupled-Device MTF Testing Method

Related Author

Zhen CHANG
Fu-qi SI
Hai-jin ZHOU
Min-jie ZHAO
Wen-qing LIU
XU Wen-hai
WU Hou-de
ZHANG Da

Related Institution

Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences Hefei
University of Science and Technology of China
College of information science and technology, Dalian Maritime University
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
Graduate University of Chinese Academy of Sciences
0