Micro Measurement: Development and Application

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- Micro Measurement: Development and Application
- Optics and Precision Engineering Vol. 6, Issue 2, Pages: 15-17(1998)
- 作者机构：
  
  中国科学院长春光学精密机械研究所, 长春 130022
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：12 December 1998，
  
  Published Online：15 April 1998，
  
  Published：15 April 1998
- 稿件说明：
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吴一辉, 贾宏光, 王立鼎. 微观测试技术及其发展应用[J]. 光学精密工程, 1998,(2): 15-17

WU Yi-Hui, JIA Hong-Guang, WANG Li-Ding . Micro Measurement: Development and Application[J]. Editorial Office of Optics and Precision Engineering, 1998,(2): 15-17
吴一辉, 贾宏光, 王立鼎. 微观测试技术及其发展应用[J]. 光学精密工程, 1998,(2): 15-17 DOI：

WU Yi-Hui, JIA Hong-Guang, WANG Li-Ding . Micro Measurement: Development and Application[J]. Editorial Office of Optics and Precision Engineering, 1998,(2): 15-17 DOI：

概述了微观测试技术的内涵及其发展趋势

分析了它的特点、作用、地位以及二十一世纪初十年代的要求

展望了该技术未来的发展趋势。

The intention of micro measurement technology is described. Besides

the characteristic

function

position and the requirement for 21 century are analyzed. Then the develop trend of this technology is look forward.

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