Research into Testing Scheme of Reliability Qualification of Complex Optoelectronic Systems

Wu Hanping

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Research into Testing Scheme of Reliability Qualification of Complex Optoelectronic Systems

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- Research into Testing Scheme of Reliability Qualification of Complex Optoelectronic Systems
- Optics and Precision Engineering Vol. 5, Issue 5, Pages: 112-120(1997)
- 作者机构：
  
  华中光电技术研究所, 武汉, 430073
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：26 February 1997，
  
  Published Online：15 October 1997，
  
  Published：15 October 1997
- 稿件说明：
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吴晗平. 复杂光电系统可靠性鉴定试验方案研究[J]. 光学精密工程, 1997,(5): 112-120

Wu Hanping. Research into Testing Scheme of Reliability Qualification of Complex Optoelectronic Systems[J]. Editorial Office of Optics and Precision Engineering, 1997,(5): 112-120
吴晗平. 复杂光电系统可靠性鉴定试验方案研究[J]. 光学精密工程, 1997,(5): 112-120 DOI：

Wu Hanping. Research into Testing Scheme of Reliability Qualification of Complex Optoelectronic Systems[J]. Editorial Office of Optics and Precision Engineering, 1997,(5): 112-120 DOI：

摘要

针对复杂光电系统实际情况

依据可靠性试验理论

分析了指数寿命型假设的统计检验

阐述了可靠性定时和定数截尾鉴定试验

以及定时试验标准方案

探讨了故障加权处理、试验剖面与综合环境条件

对复杂光电系统可靠性鉴定试验方案设计及质检验收有一定的指导意义。

Abstract

For complex optoelectronic systems

this paper

according to theory of reliability testing

analyzes statistical test for exponential life hypothesis

describes fixed-time and fixed-number censored reliability testing

and fixed time testing standard scheme

discusses weighted failuress and test profile

combined environment condition.It plays directive roles of scheme design of reliability qualification test and production acceptance for complex optoelectronic systems.

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