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Design of the Equipment for Measuring Degree of Unevenness ofLinear CCD Photosensitive Surface and Relization of Circuit
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    • Design of the Equipment for Measuring Degree of Unevenness ofLinear CCD Photosensitive Surface and Relization of Circuit

    • Optics and Precision Engineering   Vol. 6, Issue 3, Pages: 117-121(1998)

    • Received：20 February 1998，

      Revised：06 March 1998，

      Published Online：15 June 1998，

      Published：15 June 1998

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  • HE Geng-Xian . Design of the Equipment for Measuring Degree of Unevenness ofLinear CCD Photosensitive Surface and Relization of Circuit[J]. Editorial Office of Optics and Precision Engineering, 1998,(3): 117-121 DOI：

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