WANG Zhan-Shan, CHEN Xing-Dan . X-ray Normal Incidence Microscope and Its Application in ICF[J]. Editorial Office of Optics and Precision Engineering, 1999,(1): 1-9
WANG Zhan-Shan, CHEN Xing-Dan . X-ray Normal Incidence Microscope and Its Application in ICF[J]. Editorial Office of Optics and Precision Engineering, 1999,(1): 1-9DOI:
X-ray Normal Incidence Microscope and Its Application in ICF
The development of X-ray normal incidence microscope is thoroughly presented and the main technique problems that affect the performance of the X-ray normal incidence microscope are discussed.The available applications in inertial confinement fusion(ICF) are pointed out.
Research developments of extreme ultra-violet multilayers for 40-90 nm
Preparation of EUV Filter at 17.1 nm
Research progress of normal-incidence optical system at extreme ultraviolet (EUV) wavelength
Research progress of multilayer X-ray imaging optics for plasma diagnostics
Filter wheel mechanism for optical remote sensor in geostationary orbit
Related Author
WANG Zhanshan
Qi Runze
JIANG Li
LAI Bo
CHEN Bo
WANG Xiaodong
WANG Hanlin
MIAO Pengfei
Related Institution
MOE Key Laboratory of Advanced Micro-structured Materials of Ministry of Education, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering Tongji University
Shanghai Institute of Satellite Engineering
University of Chinese Academy of Sciences
Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences
Institute of Precision Optical Engineering, MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai Frontiers Science Center of Digital Optics, Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications, School of Physics Science and Engineering, Tongji University