您当前的位置:
首页 >
文章列表页 >
X-ray Normal Incidence Microscope and Its Application in ICF
更新时间:2020-08-12
    • X-ray Normal Incidence Microscope and Its Application in ICF

    • Optics and Precision Engineering   Vol. 7, Issue 1, Pages: 1-9(1999)
    • Received:04 June 1998

      Revised:10 July 1998

      Published Online:15 February 1999

      Published:15 February 1999

    移动端阅览

  • WANG Zhan-Shan, CHEN Xing-Dan . X-ray Normal Incidence Microscope and Its Application in ICF[J]. Editorial Office of Optics and Precision Engineering, 1999,(1): 1-9 DOI:

  •  
  •  

0

Views

381

下载量

1

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Research developments of extreme ultra-violet multilayers for 40-90 nm
Preparation of EUV Filter at 17.1 nm
Research progress of normal-incidence optical system at extreme ultraviolet (EUV) wavelength
Research progress of multilayer X-ray imaging optics for plasma diagnostics
Filter wheel mechanism for optical remote sensor in geostationary orbit

Related Author

WANG Zhanshan
Qi Runze
JIANG Li
LAI Bo
CHEN Bo
WANG Xiaodong
WANG Hanlin
MIAO Pengfei

Related Institution

MOE Key Laboratory of Advanced Micro-structured Materials of Ministry of Education, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering Tongji University
Shanghai Institute of Satellite Engineering
University of Chinese Academy of Sciences
Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences
Institute of Precision Optical Engineering, MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai Frontiers Science Center of Digital Optics, Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications, School of Physics Science and Engineering, Tongji University
0