Optical free form surfaces can be empolyed to realize some special imaging effects and supply more degree of design freedom. These free-form surfaces can be manufactured by compute controlled fabrication (CCF) method on low accuracy machine tool. The profile measurement studied is a key factor that determines the finish accuracy of the optical free-form surfaces in CCF

especially the coordination measuring method. Rapid coordinate measuring method (RCMM) is proposed with case study. Results indicate that measruing time can be largely reduced by RCMM

with no measuring accuracy losing.