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Quality control after matching or image using constraint of epipolar line bunch
更新时间：2020-08-12

    • Quality control after matching or image using constraint of epipolar line bunch

    • Optics and Precision Engineering   Vol. 8, Issue 3, Pages: 221-224(2000)
    • CLC： O438

    • Received：10 November 1999，

      Revised：03 April 2000，

      Published Online：15 June 2000，

      Published：15 June 2000

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  • ZENG Luan, ZHNAG Ke-dai, LI Sheng-liang. Quality control after matching or image using constraint of epipolar line bunch[J]. Editorial Office of Optics and Precision Engineering, 2000,(3): 221-224 DOI：

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