The raytracing process of an X-ray optical system is described
which may includes any number of mirrors and/or crystals with various figure shapes as well as aperture. The arrangement of optical elements may be coplanar or orthogonal to each other. Diffraction direction of a ray passing a crystal for symmetrical or asymmetrical reflection is calculated from the vector form of Laue diffraction equation. The raytracing program is written in C language
with which not only the ray spot diagram at any position in the optical system can be obtained but also the rocking-curve of a crystal can be calculated. Finally
as an example
the application of the program in calculating the imaging of an X-ray synchrotron radiation beamline system is demonstrated.
Optimized precision temperature control method and experimental validation for non-uniform discontinuous X-ray telescope
Ultra-precision machining and testing of reflector mirrors for extreme ultraviolet and X-ray
Optical property characterization of X-ray filters used in X-ray space survey
Optical property characterization of optical blocking filters used in space X-ray survey
Similarity and distinction between impulse coupling with aluminum by pulsed ultraviolet laser and by X-ray
Related Author
CHEN Yong
ZHANG Yonghe
LIAO Xing
MA Jia
FENG Jianchao
ZHANG Xiaofeng
SHEN Zhenxiang
YU Jun
Related Institution
Innovation Academy for Microsatellites of Chinese Academy of Sciences
Institute of High Energy Physics, Chinese Academy of Sciences
Institute of Precision Optical Engineering, MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai Frontiers Science Center of Digital Optics, Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications, School of Physics Science and Engineering, Tongji University
Particle Astrophysics Division, Institute of High Energy Physics, Chinese Academy of Sciences
College of Mathematics and Physics, Beijing University of Chemical Technology