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Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP
更新时间:2020-08-12
    • Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP

    • Optics and Precision Engineering   Vol. 9, Issue 5, Pages: 442-445(2001)
    • CLC: TN305.7
    • Received:29 August 2001

      Revised:22 September 2001

      Published Online:15 October 2001

      Published:15 October 2001

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  • CHEN Bo, NI Qi-liang, CAO Jian-lin . Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP[J]. Editorial Office of Optics and Precision Engineering, 2001,(5): 442-445 DOI:

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