Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP
|更新时间:2020-08-12
|
Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP
Optics and Precision EngineeringVol. 9, Issue 5, Pages: 442-445(2001)
作者机构:
State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130022, China
作者简介:
基金信息:
DOI:
CLC:TN305.7
Received:29 August 2001,
Revised:22 September 2001,
Published Online:15 October 2001,
Published:15 October 2001
稿件说明:
移动端阅览
CHEN Bo, NI Qi-liang, CAO Jian-lin . Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP[J]. 光学精密工程, 2001,(5): 442-445
CHEN Bo, NI Qi-liang, CAO Jian-lin . Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP[J]. Editorial Office of Optics and Precision Engineering, 2001,(5): 442-445
CHEN Bo, NI Qi-liang, CAO Jian-lin . Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP[J]. 光学精密工程, 2001,(5): 442-445DOI:
CHEN Bo, NI Qi-liang, CAO Jian-lin . Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP[J]. Editorial Office of Optics and Precision Engineering, 2001,(5): 442-445DOI:
Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP