a large scale area can be measured with an interferometer of small aperture by correlative stitching technique
in which high measurement precision
high spatial resolution and low price can be maintained. In this technique
a way to get high precision phase distributions of sub-apertures and effective stitching method are important. Stitching between two sub-apertures is simple
but its accumulation error may reduce stitching precision greatly. The paper presents an error averaging method
which requires that the sum of the squared differences of all common areas should be minimized simultaneously. This method is a parallel one in essence. A math model and a solution in Cartesian coordinates are presented. Their validity has been examined by computer simulation.
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references
Chen Ming-Yi, et al., Multi-aperture overlap-scanning technique for large aperture test[J]. SPIE, 1991,1553:626-635.
Bray Michael. Stitching interferometry:side effects and PSD[J]. SPIE,1999,3782:443-452.
Cheng Weiming, Chen Mingyi. Transformation and connection of subapertures in the multi-aperture overlap scanning technique for large optics tests[J]. Opt. Eng. 1993,32:1947-1950.