The latest development of optical non-contact 3D profile measurement

CHEN Xiao-rong; CAI Ping; SHI Wen-kang

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The latest development of optical non-contact 3D profile measurement

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- The latest development of optical non-contact 3D profile measurement
- Optics and Precision Engineering Vol. 10, Issue 5, Pages: 528-532(2002)
- 作者机构：
  
  上海交通大学, 电子信息学院上海,200030
- 作者简介：
- 基金信息：
- DOI：
  CLC： TB92
- Received：06 April 2002，
  
  Revised：02 July 2002，
  
  Published Online：15 October 2002，
  
  Published：15 October 2002
- 稿件说明：
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陈晓荣, 蔡萍, 施文康. 光学非接触三维形貌测量技术新进展[J]. 光学精密工程, 2002,(5): 528-532

CHEN Xiao-rong, CAI Ping, SHI Wen-kang. The latest development of optical non-contact 3D profile measurement[J]. Editorial Office of Optics and Precision Engineering, 2002,(5): 528-532
陈晓荣, 蔡萍, 施文康. 光学非接触三维形貌测量技术新进展[J]. 光学精密工程, 2002,(5): 528-532 DOI：

CHEN Xiao-rong, CAI Ping, SHI Wen-kang. The latest development of optical non-contact 3D profile measurement[J]. Editorial Office of Optics and Precision Engineering, 2002,(5): 528-532 DOI：

摘要

三维物体表面轮廓测量是获取物体形态特征的一种重要手段

在机器视觉、自动加工、工业检测、产品质量控制领域具有重要意义和广阔的应用前景.光学非接触测量由于其高分辨率、无破坏、数据获取速度快等优点而被认为是最有前途的三维形貌测量方法. 介绍了光学非接触测量方法中的光切法、基于调制度测量的原理及优缺点

重点介绍了光栅投射法的测量原理

并分析了其研究热点与发展方向.

Abstract

D profile measurement is becoming a powerful tool for obtaining the form and structure of an object. It has important significance and widespread applications in machine vision

automatic measurement

industrial inspection

quality control

etc. Because of the advantages of high resolution

non-distruction

and quick data-obtaining

etc.

it is thought to have a great future. This paper introduces some new techniques of the 3D profile measurement such as the light-section method

MMD method

and emphasizes the grating projection measurement method

giving both their advantages and disadvantages

as well as the current hot points and future directions of the last one.

关键词

Keywords

references

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