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Deep aspheric testing based on phase-shift electronic Moir? patterns
更新时间:2020-08-12
    • Deep aspheric testing based on phase-shift electronic Moir? patterns

    • Optics and Precision Engineering   Vol. 11, Issue 3, Pages: 250-255(2003)
    • CLC: O436.1
    • Received:10 December 2002

      Revised:16 March 2003

      Published Online:15 June 2003

      Published:15 June 2003

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  • CHENG Shi-dong, ZHANG Xue-jun, ZHANG Zhong-yu, ZHANG Feng . Deep aspheric testing based on phase-shift electronic Moir? patterns[J]. Editorial Office of Optics and Precision Engineering, 2003,(3): 250-255 DOI:

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