WANG Zhan-shan. Effect of film thickness errors on performance of soft X-ray multilayer[J]. Editorial Office of Optics and Precision Engineering, 2003,(2): 136-138
WANG Zhan-shan. Effect of film thickness errors on performance of soft X-ray multilayer[J]. Editorial Office of Optics and Precision Engineering, 2003,(2): 136-138DOI:
Effect of film thickness errors on performance of soft X-ray multilayer
The effect of film thickness control errors on the performance of soft X-ray multilayer is discussed in detail. The results show that the primary error is a systemic error of the instrument itself which causes the peak of reflectivity change and the secondary error is a stochastic error which control decreases the magnitude of reflectivity.
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references
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Research developments of extreme ultra-violet multilayers for 40-90 nm
Research progress of normal-incidence optical system at extreme ultraviolet (EUV) wavelength
Research progress of multilayer X-ray imaging optics for plasma diagnostics
Development of high performance and large size X-ray multilayer reflective optics
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Related Institution
BESSY
MOE Key Laboratory of Advanced Micro-structured Materials of Ministry of Education, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering Tongji University
Institute of Precision Optical Engineering, MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai Frontiers Science Center of Digital Optics, Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications, School of Physics Science and Engineering, Tongji University
Institute of Precision Optical Engineering, MOE Key Laboratory of Advanced Micro-Structured Materials, School of Physics Science and Engineering, Tongji University
Ningbo Institute of Dalian University of Technology