Reflectance calibration of different material soft X-ray planar mirrors by BSRF

SUN Ke-xu; CUI Yan-li; YI Rong-qing; JIANG Shao-en; HUANG Tian-xuan; YANG Jia-min; DING Yo

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Reflectance calibration of different material soft X-ray planar mirrors by BSRF

更新时间：2020-08-12

- Reflectance calibration of different material soft X-ray planar mirrors by BSRF
- Optics and Precision Engineering Vol. 11, Issue 4, Pages: 349-353(2003)
- 作者机构：
  
  1. 中国工程物理研究院, 激光聚变研究中心高温高密度等离子体物理国家重点实验室,四川绵阳,621900
  2. 中国科学院, 高能物理研究所, 同步辐射实验室, 北京, 100039
  3. 哈尔滨工业大学, 精密工程研究所, 黑龙江, 哈尔滨, 150001
- 作者简介：
- 基金信息：
- DOI：
  CLC： O435.1
- Received：20 January 2003，
  
  Revised：14 March 2003，
  
  Published Online：15 August 2003，
  
  Published：15 August 2003
- 稿件说明：
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孙可煦, 崔延莉, 易荣清, 江少恩, 黄天晅, 杨家敏, 丁永坤, 崔明启, 朱佩平, 赵屹东, 黎刚, 张景和. 多种材料软X光平面镜反射率标定[J]. 光学精密工程, 2003,(4): 349-353

SUN Ke-xu, CUI Yan-li, YI Rong-qing, JIANG Shao-en, HUANG Tian-xuan, YANG Jia-min, DING Yong-kun, CUI Ming-qi, ZHU Pei-ping, ZHAO Yi-dong, LI Gang, ZHANG Jing-he. Reflectance calibration of different material soft X-ray planar mirrors by BSRF[J]. Editorial Office of Optics and Precision Engineering, 2003,(4): 349-353
孙可煦, 崔延莉, 易荣清, 江少恩, 黄天晅, 杨家敏, 丁永坤, 崔明启, 朱佩平, 赵屹东, 黎刚, 张景和. 多种材料软X光平面镜反射率标定[J]. 光学精密工程, 2003,(4): 349-353 DOI：

SUN Ke-xu, CUI Yan-li, YI Rong-qing, JIANG Shao-en, HUANG Tian-xuan, YANG Jia-min, DING Yong-kun, CUI Ming-qi, ZHU Pei-ping, ZHAO Yi-dong, LI Gang, ZHANG Jing-he. Reflectance calibration of different material soft X-ray planar mirrors by BSRF[J]. Editorial Office of Optics and Precision Engineering, 2003,(4): 349-353 DOI：

摘要

利用北京同步辐射装置(BSRF) 3W1B束线及反射率计靶室

在束流强度40～120mA、贮存环电子能量2GeV专用光运行模式下

做了不同材料掠入射平面镜反射率标定实验。标定过程用高灵敏度无死层的硅光二极管代替X射线二极管(XRD)作探测器

使输出信号提高2～3个量级

可标定能区从150～270eV拓展为50～1500eV能区

对C

Si和Ni材料平面镜给出完整的反射率标定曲线

最终把实验数据与理论计算比对并分析。

Abstract

Beijing synchrotron radiation facility(BSRF) 3W1B beam line with beam current of 40～120 mA

storage ring electron energy of 2 GeV and photon energy of 50～1 500 eV was used to conduct experiments on the reflectance calibration method. The XRD detectors of planar mirror facility were replaced by AXUV 100

increasing the rate of signal versus noise by 2 to 3 orders of magnitude

and the calibration region of 150～270 eV has been expanded to be 50～1 500 eV. The reflectivity calibration curves for 5℃

Si and Ni planar mirrors are given

and the values of experiment and calculation are compared and analyzed.

关键词

Keywords

references

孙可煦,杨建国,郑志坚.用于激光等离子体诊断的亚千X射线能谱仪[J].强激光与粒子束,1990,2(1):16-22.SUN K X, YANG J G, ZHENG ZH J.High power laser and particle beams[J].High Power Laser and Particle Beams,1990,2(1):16-22.(in Chinese)

TIRSELL K G. Time resolved sub-KeV X-ray measurements using filtered X-ray diodes,UCRL-81478[Z],1979.

孙可煦,马洪良,徐和平,等.X光掠入射平面镜反射率标定及应用[J].光学学报,1993,13(10):934-939.SUN K X, MA H L, XU H P, et al.The reflectance of X-ray grazing planar mirror and application[J]. Acta Optica Sinica,1993,13(10):934-939.(in Chinese)

HEINLE R A,TIRSE1L K G.Filtered-mirror sub-keV X-ray measurement system[J].LaserProgram Annual Report,1979,5:5-5.7.

许顺生.金属X射线学[M].上海:上海科学技术出版社,1964.13-15.XU S S.X-ray for metals[M].Shanghai:Shanghai Science Engineering Press Publish,1964.13-15.(in Chinese)

崔明启,刘丽冰,徐文轩,等.北京同步辐射装置3B1束线精细调试[J]. 高能物理与核物理,1992,16(8):673-678.CUI M Q, LIU L B, XU W X, et al. High energy physics and nuclear physics[J]. High energy physics and nuclear physics,1992,16(8):673-678.(in Chinese)

崔明启,崔聪悟,朱佩平,等.软X射线绝对强度测量系统和它的标定[J].高能物理与核物理,1998,22(2):180-185.CUI C W, CUI M Q, ZHU P P,et al. The measuring system for soft X-ray absolute intensity and its calibration[J]. High Energy Physics and Nuclear Physics, 1998, 22(2):180-185.(in Chinese)

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