LIU Xiao-jun, GAO Yong-sheng. Accurate phase recovery algorithm in lateral shearing interferometry[J]. Editorial Office of Optics and Precision Engineering, 2004,(5): 471-479
LIU Xiao-jun, GAO Yong-sheng. Accurate phase recovery algorithm in lateral shearing interferometry[J]. Editorial Office of Optics and Precision Engineering, 2004,(5): 471-479DOI:
Accurate phase recovery algorithm in lateral shearing interferometry
A phase recovery algorithm with improved accuracy and efficiency is proposed for test wavefront phase recovery from obtained phase differences in shearing interferometry. The algorithm is based on complete pixel by pixel mapping relationship between test phase and its differences
together with the least square principle. In the algorithm
a special linear equation set is firstly built
from which the test phase can be obtained directly by equation solving. Since the coefficient matrix of the equation is sparse
it is transferred to a small new matrix to reduce memory need and calculation amount. In the meantime
since the matrix is a positive-defined matrix
Choleski's factorzation is adopted for convenient equation solving. Reduced time cost and computer memory need and improved recovery accuracy and efficiency have been demonstrated by computational and experimental testing on the proposed algorithm and its comparison with others. Good noise suppression ability is proved by error propagation characteristic analysis.
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references
MANTRAVADI M V. Lateral shearing Interferometers [M] .in Optical Shop Testing, 2 nd Edited by Daniel Malacara, John wiley and Sons, Inc. 1992.
OKUDA S, NOMURA T, KAMIYA K, et al, High-precision analysis of a lateral shearing interferogram by using the integration method and polynomials[J] . Appl. Opt.,2000,39(28):5179-5186.
TIAN X K, MASAHIDE L, TOYOHIKO Y.Simple algorithm for large-grid phase reconstruction of lateral-shearing interferomatry[J] . Appl. Opt., 1995,34(31):7213-7220.
DAVIS N,FRITZ T A. Application of zernike polynomials to reduction of wave-front slope data [M] . Internal report, Optical Science Center, University of Arizona,1977:39-42.
SHEN W,CHANG M W,WAN D SH.Zernike polynomial fitting of lateral shearing interferometry[J] .Opt. Eng., 1997,36(3):905-913.
HARBERS G, KUNST P J, LEIBBRANDT G W R.Analysis of lateral shearing interferograms by use of zernike polynomials[J] . Appl. opt.,1996,35(31):6162-6172.
Von BRUG H. Zernike polynomials as a basis for wavefront fitting in latering shearing interferometry[J] . Appl. Opt.,1997,36(13):2788-2790.
FRANCOIS R, CLAUDE R, Wavefront reconstruction using iterative Fourier transforms[J] . Appl. Opt.,1991,30(11):1352-1360.
LOHEIDE S, WEINGARTNER I, New procedures for wavefront reconstruction[J] . Optik, 1998,108(2):53-62.
ELSTER C.Exact two-dimensional wavefront reconstruction from lateral shearing interferograms with large shears[J] . Appl. Opt.,2000,33(2):5353-5359.
FREISCHALD K R,KOLIOPOULOS C. Modal estimation of a wavefront from difference measurements using the discrete Fourier transform[J] . J. Opt. Soc. Am. A.,1986,(3):1852-1861.
HUNT B R.Matrix formation of the reconstruction of phase from phase differences[J] . J. Opt. Soc. Am., 1979,69(3):393-399.
FRIED D L.Least-square fitting a wave-front distoration estimate to an array of phase-difference measurements[J] . J. Opt. Soc. Am.,1977,67:370-375.
GHIGLIA D C,ROMERO L A. Direct phase estimation from phase differences using elliptic partial differential equation solvers[J] . Opt. Lett.,1989,14:1107-1109.
TAKAJO H. Least-square phase estimation from the phase difference[J] . J. Opt. Soc. Am.,1988,5(3):416-425.
DOUGLAS F J.Numerical methods, 2 nd edition [M] . Brooks/Cole Publishing Company, 1998.
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Related Author
ZHU Meng
LI Xiang-yu
LONG Ning-bo
HUANG Zhan-hua
LI Hong-yue
Related Institution
Key Laboratory of Opto-electronics Information Technology of the Ministry of Education, College of Precision Instrument and Optoelectronics Engineering, Tianjin University