A wavelet-based focus measure and 3-D autofocusing for microscope images
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A wavelet-based focus measure and 3-D autofocusing for microscope images
Optics and Precision EngineeringVol. 14, Issue 6, Pages: 1063-1069(2006)
作者机构:
1. 哈尔滨理工大学 现代制造技术与刀具开发省高校重点实验室,黑龙江 哈尔滨,150080
2. 哈尔滨工业大学 机器人研究所,黑龙江 哈尔滨,150001
作者简介:
基金信息:
DOI:
CLC:TP113
Received:12 April 2006,
Revised:27 October 2006,
Published Online:30 December 2006,
Published:30 December 2006
稿件说明:
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WANG Yi-wen, LIU Xian-li, XIE Hui. A wavelet-based focus measure and 3-D autofocusing for microscope images[J]. Optics and precision engineering, 2006, 14(6): 1063-1069.
DOI:
WANG Yi-wen, LIU Xian-li, XIE Hui. A wavelet-based focus measure and 3-D autofocusing for microscope images[J]. Optics and precision engineering, 2006, 14(6): 1063-1069.DOI:
A wavelet-based focus measure and 3-D autofocusing for microscope images
A new wavelet-based focus measure was proposed. High
NA
(Numerical Aperture) and low
NA
microscope image sequences were used to compare the performance of this focus measure with the classic and popular focus measures Normalized Variance
Entropy
Energy Laplace and other two Wavelet-based High Frequency focus measures. The robustness of these focus measures was also compared using image sequence corrupted by Gaussian white noise with that of standard deviations 25. Experimental results show that the proposed focus measure can provide significantly better depth resolution and accuracy than the comparing ones
and exhibit comparatively good robustness with Normalized Variance. A selective focusing technique for autofocusing on the three dimension microscale objects in different depth was developed. The results also show that this focus measure and selective autofocusing techniques can be widely applied to automated micromanipulation; and that autofocusing is of fundamental importance to automated micromanipulation