The mechanism of optoelectronic non-uniformity characteristic in Image Intensified Charge Coupled Device(ICCD) was analyzed

and then a response characteristic mathematic model was proposed. Base on the two-point multi-section method

a non-uniformity equation of ICCD in ultraviolet imager was given and correction coefficients were obtained in specific experiment condition. In the experiments

it is found that the "snow like flicker" (mainly composed of the shot noises of detector) and blind pixels are the main factors of the non-uniformity improvement

which can be compensated by the response values under corresponding illumination. The results show that the compensated and corrected image has effectively reduced the measurement error brought by non-uniformity of the detector and the uniformity decreases by 37.1%. Proposed method and experiment can reduce the intrinsic pattern noise brought by the physical characteristics of ICCD and fabrication defects in certain degree.