您当前的位置:
首页 >
文章列表页 >
Multilayer-based soft X-ray polarimetry
Article | 更新时间:2020-08-12
    • Multilayer-based soft X-ray polarimetry

    • Optics and Precision Engineering   Vol. 15, Issue 12, Pages: 1850-1861(2007)
    • CLC: O434.12
    • Received:20 August 2007

      Revised:10 October 2007

      Published Online:30 December 2007

      Published:30 December 2007

    移动端阅览

  • Franz Schaefers. Multilayer-based soft X-ray polarimetry[J]. Optics and precision engineering, 2007, 15(12): 1850-1861. DOI:

  •  
  •  

0

Views

565

下载量

1

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Broadband aperiodic Mo/Si multilayer polarization elements for EUV region
Effect of film thickness errors on performance of soft X-ray multilayer
Research developments of extreme ultra-violet multilayers for 40-90 nm
Research progress of normal-incidence optical system at extreme ultraviolet (EUV) wavelength
Research progress of multilayer X-ray imaging optics for plasma diagnostics

Related Author

ZHU Jing-tao
WANG Zhan-shan
WANG Hong-chang
ZHANG Zhong
WANG Feng-li
QIN Shu-ji
CHEN Ling-yan
CUI Ming-qi

Related Institution

National Synchrotron Radiation Laboratory, University of Science and Technology of China
Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences
Institute of Precision Optical Engineering, Physics Department, Tongji University
Department of Physics, Institute of Precision Optical Engineering
MOE Key Laboratory of Advanced Micro-structured Materials of Ministry of Education, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering Tongji University
0