Mechanical property of sagittal focusing crystal and effect of slope error on incidence angle
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Mechanical property of sagittal focusing crystal and effect of slope error on incidence angle
Optics and Precision EngineeringVol. 15, Issue 3, Pages: 362-367(2007)
作者机构:
中国科学技术大学 国家同步辐射实验室,安徽 合肥,230026
作者简介:
基金信息:
DOI:
CLC:TL544
Received:23 March 2006,
Revised:20 December 2006,
Published Online:30 June 2007,
Published:30 June 2007
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FENG Liang-jie, DONG Xiao-hao, KANG Le, et al. Mechanical property of sagittal focusing crystal and effect of slope error on incidence angle[J]. Optics and precision engineering, 2007, 15(3): 362-367.
DOI:
FENG Liang-jie, DONG Xiao-hao, KANG Le, et al. Mechanical property of sagittal focusing crystal and effect of slope error on incidence angle[J]. Optics and precision engineering, 2007, 15(3): 362-367.DOI:
Mechanical property of sagittal focusing crystal and effect of slope error on incidence angle
The principle of dynamically bending of the crystal in a sagittal focusing monochramator by flexural hinge-based bender was presented and the geometric parameters of bender and crystal were optimized. Then the mechanical properties of bender and crystal were analyzed with Finite Element Method. Finally
the effect of slop error on the incident angle was calculated. The analyzed results indicate that the acceptance angle of the monochromator increases from 1 mrad to 3 mrad
and the horizontal width (FWHM) of the spot on the sample reduces from 12.5 mm to 2.5 mm after replacement.The anticlastic curvature caused by bending is 1 700 times as long as the sagittal curvature
and the incident angle error is only 2.2 μrad. The Von Mize stress on the bender is about 800 MPa. When Beryllium-Cu is selected as the material of the bender
the linear relationship between the curvature of crystal in 0.57~1.72 m and the driving forces in 8~2.67 N is obtained. The analyzed results also indicate that the designing parameters are achievement in that the flux and photo intensity are increased and the requirement of fast and tunable scanning on the XAFS measurement is satisfied at the same time.
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references
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