The application of ray tracing method in birefringent filter error analysis

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The application of ray tracing method in birefringent filter error analysis

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- The application of ray tracing method in birefringent filter error analysis
- Optics and Precision Engineering Vol. 16, Issue 5, Pages: 771-777(2008)
- 作者机构：
  
  1. 中国科学院研究生院
  2. 中国科学院国家天文台
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：10 December 2007，
  
  Revised：09 January 2008，
  
  Published Online：22 May 2008，
  
  Published：22 May 2008
- 稿件说明：
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玄伟佳,王东光,邓元勇,张志勇,孙英姿. 光线追迹方法在双折射滤光器误差分析中的应用[J]. 光学精密工程, 2008,16(5):771-777

The application of ray tracing method in birefringent filter error analysis[J]. Optics and precision engineering, 2008, 16(5): 771-777.
玄伟佳,王东光,邓元勇,张志勇,孙英姿. 光线追迹方法在双折射滤光器误差分析中的应用[J]. 光学精密工程, 2008,16(5):771-777 DOI：

The application of ray tracing method in birefringent filter error analysis[J]. Optics and precision engineering, 2008, 16(5): 771-777. DOI：

摘要

目的：对于采用双折射滤光器系统的太阳磁场望远镜，滤光器的研制质量直接影响透过谱线形状，进而影响太阳磁场的测量。方法：从单轴晶体的双折射性质出发，应用光线追迹方法，研究了滤光器系统中光的传播规律，将光线的传播方向、相位信息和振动状态用入射角、入射光方位角和晶体参量表示出来，结合偏振光的干涉原理，辅助计算机编程，分析了多种误差源对透过谱线形状的影响，为滤光器的研制提供了可靠依据。结果：通过与Evans离轴效应公式的对比，得到0.7%的最大相对误差，从而验证了本文方法的正确性。

Abstract

Objective: For solar magnetic field telescope with birefringent filter system

the quality of filter directly affects the line shape

and then the measurement of solar magnetic field. Method: According to the property of uniaxial crystal

the ray tracing method can be used to study the transmission law of ray in the filter system. With this method the ray trace

phase and vibration can be expressed by incident angle

azimuth and crystal parameters. Combining with the polarization interference theory

the effect of different error sources on the line shape can be analyzed by computer program. This method provides a reliable basis for the development of filter. Result: The maximum relative error is 0.7%

comparing with Evans equation

which demonstrates the exactitude of method in this paper.

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Related Institution

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中国科学院国家天文台

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