Research on Self-testing Method of Spatial Camera Controller Based on Mixed Language Programming

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Research on Self-testing Method of Spatial Camera Controller Based on Mixed Language Programming

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- Research on Self-testing Method of Spatial Camera Controller Based on Mixed Language Programming
- Optics and Precision Engineering Vol. 16, Issue 9, Pages: 1635-1641(2008)
- 作者机构：
  
  中国科学院长春光学精密机械与物理研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC： V445.8
- Received：23 April 2008，
  
  Revised：10 June 2008，
  
  Published Online：25 September 2008，
  
  Published：25 September 2008
- 稿件说明：
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武星星,刘金国,孔德柱,徐东,吕世良. 基于混合编程的空间相机控制器自检方法研究[J]. 光学精密工程, 2008,16(9):1635-1641

Research on Self-testing Method of Spatial Camera Controller Based on Mixed Language Programming[J]. Optics and precision engineering, 2008, 16(9): 1635-1641.
武星星,刘金国,孔德柱,徐东,吕世良. 基于混合编程的空间相机控制器自检方法研究[J]. 光学精密工程, 2008,16(9):1635-1641 DOI：

Research on Self-testing Method of Spatial Camera Controller Based on Mixed Language Programming[J]. Optics and precision engineering, 2008, 16(9): 1635-1641. DOI：

摘要

提出了一种基于混合编程的DSP空间相机控制器自检方法，按该方法修改运行时支持库，解决了混合编程下变量换区存储这一难题，降低了像移匹配算法在DSP空间相机控制器上的实现难度，提高了代码的可维护性和可移植性。对指令系统、只读存储器、随机读写存储器和其他外设及接口自检算法在具体实现中的问题进行了分析和解决。用改进的谷值检测法进行RAM自检，提高了自检效率。针对自检算法在不损害硬件的前提下难以验证的现状，给出了DSP空间相机控制器自检算法的验证方法。验证实验结果和工程实际应用效果表明自检算法实用有效。

Abstract

A self-testing method of Digital Signal Processor（DSP） spatial camera controller based on mixed language programming is advanced. With this method the difficult problem of changing variables location in RAM according to self-testing results under mixed language programming is solved by modification of Runtime-Support Library. In this way it is easier to realize the complex algorithm of matching Linear Charge Coupled Device (CCD) camera’s row period to image motion in DSP spatial camera controller. In addition codes are more maintainable and transplantable. Problems in realization of self-testing arithmetic on DSP repertoire

Read Only Memory（ROM）

Random Access Memory（RAM） and other peripherals are analyzed and solved. An improved peak value test algorithm of RAM is put forward

which has higher test efficiency. As it is difficult to test self-testing algorithm itself without harming hardware

methods to validate self-testing algorithm are presented. DSP repertoire and RAM self-testing algorithms are tested with the use of emulator. Results of validation experiments and practical application effects in engineering prove that the self-testing algorithm is practical and valid.

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