Xu-hu Xie, Shengyi Li. Material removal efficiency in ion figuring process for optical components[J]. Optics and precision engineering, 2008, 16(8): 1343-1348.
Xu-hu Xie, Shengyi Li. Material removal efficiency in ion figuring process for optical components[J]. Optics and precision engineering, 2008, 16(8): 1343-1348.DOI:
Material removal efficiency in ion figuring process for optical components
The removal efficiency and the relative removal efficiency between two different materials with three performance factors
normal removal rate
volume removal rate and sputtering yield are analyzed in the ion beam figuring process. With the Sigmund sputtering theory
build up are the relation models between these three factors and the processing parameters
such as ion energy
ion flux and ion incident angle. Experiments with samples of Zerodur
SiO2 and K4 are made to analyze these relations. The experimental results verify the theoretical models. The models and experimental results indicate that the removal rate increases with ion current linearly and is about proportional to the square root of the ion energy. The removal rate increases with incident angle and climbes the summit at about 60~80°; the relative removal efficiency is independent of ion flux; the energy effect of the relative removal efficiency can be ignored and the angle effect is rather obvious.
Error analysis of ion beam figuring for fabrication of continuous phase plates with small feature structures
Material removal property in ion figuring process for optical components
Related Author
Ming-jin XU
Yi-fan DAI
Xu-hui XIE
Lin ZHOU
JIAO Chang-jun
LI Sheng-yi
WANG Deng-feng
XIE Xu-hui
Related Institution
College of Mechatronics Engineering and Automation, Hu'nan Key Laboratory of Ultra-precision Machining Technology, National University of Defense Technology
School of Mechanic Engineering and Automation, National University of Defense Technology