您当前的位置：
首页 >
文章列表页 >
The study of TDI pattern for interline transfer progressive scan CCD
Article | 更新时间：2020-08-12

    • The study of TDI pattern for interline transfer progressive scan CCD

    • Optics and Precision Engineering   Vol. 16, Issue 9, Pages: 1629-1634(2008)
    • CLC： TN47

    • Received：26 March 2008，

      Revised：10 June 2008，

      Published Online：25 September 2008，

      Published：25 September 2008

    移动端阅览

  • The study of TDI pattern for interline transfer progressive scan CCD[J]. Optics and precision engineering, 2008, 16(9): 1629-1634. DOI：

  •  
  •  

0

Views

536

下载量

12

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Optical properties and quantum efficiency of multilayer complicated GaAs-based photocathode
Quantum efficiency test system based on focusing scanning for linear array camera
CCD irradiance calibration algorithm for HDR image acquisition
Testing system for radiation effects of CCD and CMOS image sensors
Fiber coupling of superconducting nanowire single-photon detectors

Related Author

FENG Cheng
LIU Jian
ZHANG Yijun
QIAN Yunsheng
Yan-fu TANG
Jun-lin LI
Yong-qiang YANG
Zhong-ming LI

Related Institution

School of Electronic and Optical Engineering， Nanjing University of Science and Technology
Fundamental Education and Experimental Center， Nanjing University of Science and Technology
School of Information and Communication Engineering， Nanjing Institute of Technology
Changchun Institute of Optics，Fine Mechanics and Physics，Chinese Academy of Sciences
School of Electronic Science and Engineering，Nanjing University
0