您当前的位置:
首页 >
文章列表页 >
Thermal Design and Proof Test of CCD Component in Spectral Imaging Apparatus
Article | 更新时间:2020-08-12
    • Thermal Design and Proof Test of CCD Component in Spectral Imaging Apparatus

    • Optics and Precision Engineering   Vol. 17, Issue 10, Pages: 2440-2444(2009)
    • Received:04 November 2008

      Revised:12 December 2008

      Published Online:20 October 2009

      Published:20 October 2009

    移动端阅览

  • Thermal Design and Proof Test of CCD Component in Spectral Imaging Apparatus[J]. Optics and precision engineering, 2009, 17(10): 2440-2444. DOI:

  •  
  •  

0

Views

151

下载量

12

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Thermal design of space spectral imaging apparatus and its analysis and verification
Thermal analysis and verification of CCD components in spectral imagers at steady and transient states
Thermal control system of carbon dioxide detection instrument
Thermal design and verification of micro remote-sensing satellite in low inclination orbit
Thermal design and validation of multispectral max width optical remote sensing satellite

Related Author

GUO Liang
WU Qing-wen
YAN Chang-xiang
GUO Liang
WU Qing-wen
YAN Chang-xiang
LIU Ju
CHEN Li-heng

Related Institution

Graduate University of Chinese Academy of Sciences
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
Graduate University of Chinese Academy of Sciences, Beijing 100039, China
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
University of Chinese Academy of Sciences
0