Aligning and testing of optical system of echelle spectrography

LI Na-na; AN Zhi-yong; CUI Ji-cheng

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Aligning and testing of optical system of echelle spectrography

Article | 更新时间：2020-08-12

- Aligning and testing of optical system of echelle spectrography
- Optics and Precision Engineering Vol. 17, Issue 3, Pages: 531-536(2009)
- 作者机构：
  
  1. 中国科学院长春光学精密机械与物理研究所,吉林长春,中国,130033
  2. 长春理工大学,吉林长春,130022
  3. 中国科学院光电研究院北京,100080
- 作者简介：
- 基金信息：
- DOI：
  CLC： TH703;TH744.1
- Received：22 April 2008，
  
  Revised：18 November 2008，
  
  Published Online：25 March 2009，
  
  Published：25 March 2009
- 稿件说明：
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李娜娜, 安志勇, 崔继承. 中阶梯光栅光谱仪光学系统的安装及检测[J]. 光学精密工程, 2009,17(3): 531-536

LI Na-na, AN Zhi-yong, CUI Ji-cheng. Aligning and testing of optical system of echelle spectrography[J]. Editorial Office of Optics and Precision Engineering, 2009,17(3): 531-536
李娜娜, 安志勇, 崔继承. 中阶梯光栅光谱仪光学系统的安装及检测[J]. 光学精密工程, 2009,17(3): 531-536 DOI：

LI Na-na, AN Zhi-yong, CUI Ji-cheng. Aligning and testing of optical system of echelle spectrography[J]. Editorial Office of Optics and Precision Engineering, 2009,17(3): 531-536 DOI：

摘要

为提高系统分辨率

保证成像质量

研究了中阶梯光栅光谱仪光学系统的安装及检测方法。通过对光学系统中狭缝、准直镜、棱镜、中阶梯光栅及聚焦镜的准确安装

使之达到设计精度要求。介绍了中阶梯光栅光谱仪所特有的光学元件的安装方法及保证精度的手段。最后

对光学系统的分辨率进行了检测

以瑞利判据为基础推导出分辨率的计算公式

并实际测量得出中阶梯光栅光谱仪的分辨率已达到10 000

满足了设计要求。提出的安装方法可为同类精密仪器的安装和调试提供参考。

Abstract

To improve system resolution and image quality

the characteristics of echelle grating spectrography were introduced and a method of fixing and checking for the optical system of the echelle spectrograph was researched.Proposed method could reach the precision of the design through fixing the slot

collimation lens

prism

echelle grating and focusing lens.A special fixing method for the echelle grating spectrography during the fixing process was also introduced. Finally

a calculation formula was deduced based on Reyleigh principle to check the resolution of the echelle grating spectrography. The checked result shows that the resolution of the echelle grating spectrography meet the system requerement of 10 000.These results reported here mean that propose method can offer a reference for fixing and adjusting of other precision instruments.

关键词

Keywords

references

武旭华,朱永田,王磊. 高分辨率阶梯光栅光谱仪的光学设计[J]. 光学精密工程,2003,13(5):442-447. WU X H,ZHU Y T,WANG L. Optical design of high resolution echelle spectrograph[J]. Opt. Precision Eng.,2003,13(5):442-447.(in Chinese)[2] HARRION G R,ARCHER J E,CAMUS J.A fixed-focus broad-range echelle spectrograph of high speed and resolving power[J]. J. Opt. Soc. Am.,1952,42(10):706-712.[3] ZHU Y, XU W. Optical and IR telescope instrumentation and detectors . Washington, USA: SPIE, 2000:141-147.[4] WANG SH G, SU D Q,CHU Y Q, et al.. Special configuration of a very large Schmidt telescope for extensive astronomical spectroscopic observation[J]. Applied Optics, 1996, 35(25):5155-5161.[5] TULL R G. Instrumentation in astronomy Ⅷ . Washington, USA: SPIE, 1994:674-684.[6] SCHROEDER D J. An echelle spectrometer-spectrograph for astronomical use[J]. Applied Optics, 1967, 6(11):1976-1980.

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