Design of Self-Check Figures Based on Linear CCD Imaging System

doi:null

您当前的位置：

首页 >

文章列表页 >

Design of Self-Check Figures Based on Linear CCD Imaging System

Article | 更新时间：2020-08-12

- Design of Self-Check Figures Based on Linear CCD Imaging System
- Optics and Precision Engineering Vol. 17, Issue 8, Pages: 2011-2016(2009)
- 作者机构：
  
  中科院长春光学精密机械与物理研究所2. 长春光学精密机械与物理研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：07 July 2008，
  
  Revised：29 October 2008，
  
  Published Online：20 August 2009，
  
  Published：20 August 2009
- 稿件说明：
移动端阅览
王文华,何斌,任建岳. 基于线阵CCD的成像系统自校图形设计[J]. 光学精密工程, 2009,17(8):2011-2016

Design of Self-Check Figures Based on Linear CCD Imaging System[J]. Optics and precision engineering, 2009, 17(8): 2011-2016.
王文华,何斌,任建岳. 基于线阵CCD的成像系统自校图形设计[J]. 光学精密工程, 2009,17(8):2011-2016 DOI：

Design of Self-Check Figures Based on Linear CCD Imaging System[J]. Optics and precision engineering, 2009, 17(8): 2011-2016. DOI：

摘要

CCD成像系统组成复杂，为便于调试和检测系统接口可靠性，需要设计一系列自校图形，其作用相当于模拟CCD图像数据，因此应具有类似线阵CCD推扫成像的动态滚动特性，同时要求图形灰度等级变化明显，且在x和y方向上均有灰度梯度。自校图形种类繁多，本文详细阐述了鉴别率图的设计思想、代码实现及自校意义。设计选用FPGA硬件VHDL编程来实现，应用TEXTIO功能通过Modelsim门级仿真将自校图形数据输出到文本，然后调用MATLAB读取文本并显示图形以验证设计的正确性。几个自校图形在CCD遥感相机成像系统中得到应用，起到了良好的检测效果。

Abstract

To proof reliability of the complicated CCD imaging system and to debug it easily

self-check figures are indispensable as image data simulation source. These figures should have the characteristic of push-scan similar to linear CCD

and have variety in gray in column and row direction. As one of numerous figures

this paper elaborates on the distinguishing figure's design procedure

implement and significance. This design was implemented with VHDL language programming based FPGA. The author applied TEXTIO function to export figure data to a text through gate-level simulation with Modesim

then imported the text and showed the expected figure in MATLAB. These figures have been applied and proved out in a CCD imaging system.

关键词

Keywords

references

Views

626

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Multiple linear CCD pose measuring optical system

Optoelectronic inspection of defects for metal cylindrical workpieces

Attitude measurement of space objects based on multi-linear CCD and multi-point cooperation target

Chin-Shifrin inversion algorithm for measuring of particle size distribution by laser diffraction method

Influences analysis of the pentaprism scannig system due to alignment error and fabrication angles error

Related Author

WANG Yan

LI Kai

YUAN Feng

HU Ying-hui

CHANG Yong-xin

LIU Lin

XIE Yu

YE Yu-tang

Related Institution

College of Electrical Engineering and Automation, Harbin Institute of Technology

School of Opto-electronic Information, University of Electronic Science and Technology of China

Institute of Optics and Electronics, Chinese Academy of Sciences

College of Electrical Engineering and Automation, Harbin Institute of Technology

Department of Optics and Optical Engineering, University of Science and Technology of China

AI问答

Address：No.3888 Dong Nanhu Road, Changchun, Jilin, China Postal code：130033
Tel：0431-86176855 Email：gxjmgc@ciomp.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 吉ICP备11002662号-17 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰