Monocular measurement in a binocular measurement system with instantaneous random illumination[J]. Optics and precision engineering, 2010, 18(1): 257-265.
Monocular measurement in a binocular measurement system with instantaneous random illumination[J]. Optics and precision engineering, 2010, 18(1): 257-265.DOI:
Monocular measurement in a binocular measurement system with instantaneous random illumination
For the characteristics of binocular stereo measurement system based on random pattern projection
a novel method for measurement was presented
where each monocular measurement system was composed of single camera and the projector. First
a simple and effective calibration algorithm was proposed to reconstruct the ray
which every point of the random pattern plate projected through projector lens. The calibration was done by just taking several images (called calibrated images) of the common white board with random illumination in different orientations. It is unnecessary to calibrate the distortion of projector lens
and its precision can tolerate the effect of the distortion of projector lens. Then
the object’s image captured in random illumination was matched with the calibrated image at sub-pixel location
and the 3D point cloud data of the target object were obtained by triangulation principle. Finally
a standard plane was measured to verify the measuring accuracy of monocular method
and several measurement examples were concretely provided. Experimental results indicate that the precision of flat measurement is 0.0175mm
and the uncertainty is 0.05mm(3σ). Since a space point does not need to be observed by both cameras in monocular measurement system
it avoids losing 3D data resulted from local highlight and self occlusion
and effectively makes up for the lack of binocular measurement system.
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Related Author
XIONG Zhi
ZHONG Chenxiaopeng
ZHANG Hao
JIA Xiaodong
GUO Zhengnan
ZHAO Ziyue
ZHAI Zhongsheng
ZHOU Weihu
Related Institution
Institute of Microelectronics, Chinese Academy of Sciences
Changcheng Institute of Metrology & Measurement
Hubei Key Laboratory of Modern Manufacture Quality Engineering, School of Mechanical Engineering, Hubei Wniversity of Technology
Shenzhen Key Laboratory of Intelligent Optical Measurement and Detection, College of Physics and Optoelectronic Engineering, Shenzhen University
Ministry of Education/Guangdong Province Key Laboratory of Optoelectronic Devices and Systems, College of Physics and Optoelectronic Engineering, Shenzhen University