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Optical property characterization of X-ray filters used in X-ray space survey
更新时间：2020-08-13

    • Optical property characterization of X-ray filters used in X-ray space survey

    • Optics and Precision Engineering   Vol. 27, Issue 11, Pages: 2337-2342(2019)
    • CLC： P171.3

    • Received：15 July 2019，

      Revised：14 August 2019，

      Published Online：15 November 2019，

      Published：15 November 2019

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  • CHEN Tian-xiang, GAO Na, LI Lin etc. Optical property characterization of X-ray filters used in X-ray space survey[J]. Editorial Office of Optics and Precision Engineering, 2019,27(11): 2337-2342 DOI：

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Na GAO
Lin LI
Yong CHEN
Yu-peng XU
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CHEN Yong
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Related Institution

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