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Use self-made TIS scatterometer to evaluate the performance of the surface modification of silicon carbide mirror
Article | 更新时间:2020-08-13
    • Use self-made TIS scatterometer to evaluate the performance of the surface modification of silicon carbide mirror

    • Optics and Precision Engineering   Vol. 16, Issue 10, Pages: 1841-1846(2008)
    • CLC: 0484.4;TN307
    • Received:16 May 2008

      Revised:13 June 2008

      Published Online:25 October 2008

      Published:25 October 2008

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  • Use self-made TIS scatterometer to evaluate the performance of the surface modification of silicon carbide mirror[J]. Optics and precision engineering, 2008, 16(10): 1841-1846. DOI:

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申振峰
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