Aberrations of plane-symmetric optical systems(Part I-Extension of aberration theory)

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Aberrations of plane-symmetric optical systems(Part I-Extension of aberration theory)

Article | 更新时间：2020-08-13

- Aberrations of plane-symmetric optical systems(Part I-Extension of aberration theory)
- Optics and Precision Engineering Vol. 17, Issue 12, Pages: 2975-2982(2009)
- 作者机构：
  
  上海大学
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：15 December 2008，
  
  Revised：25 February 2009，
  
  Published Online：25 December 2009，
  
  Published：25 December 2009
- 稿件说明：
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吕丽军,石亮. 平面对称光学系统的像差(I-像差理论的扩展)[J]. 光学精密工程, 2009,17(12):2975-2982

Aberrations of plane-symmetric optical systems(Part I-Extension of aberration theory)[J]. Optics and precision engineering, 2009, 17(12): 2975-2982.
吕丽军,石亮. 平面对称光学系统的像差(I-像差理论的扩展)[J]. 光学精密工程, 2009,17(12):2975-2982 DOI：

Aberrations of plane-symmetric optical systems(Part I-Extension of aberration theory)[J]. Optics and precision engineering, 2009, 17(12): 2975-2982. DOI：

摘要

扩展平面对称光栅系统的像差理论，使之适用于光线斜入射下平面对称折射光学系统的像差计算。结果使反射、衍射、折射光学系统的像差系数用同一组公式表达；应用基于费马原理的光线追迹解析法可以验证结果表达式的正确性。阐述了如何应用我们的波像差系数，导出轴对称对称光学系统的赛德尔初级像差。另外，文章还研究了当主光线位置改变所产生的像差修正。

Abstract

The aberration theory of plane-symmetric grating systems are extended to be applicable to the aberration analysis of refractive plane-symmetric systems. As a result

the aberrations for plane-symmetric reflective and refractive optical systems are expressed in a unified set of formulae. They can be validated by the analytical formulae of ray-tracing spot diagram based on the Fermat’s principle. It is described how to use our wave-aberration coefficients to derive the Seidel aberration in the case of axially symmetric refractive systems. Moreover

the modification of wave and ray aberrations is studied when the entrance pupil is displaced from the optical surface.

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