Study on edge detection algorithms of micro accessory

Zhi-jing ZHANG

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Study on edge detection algorithms of micro accessory

Article | 更新时间：2020-08-13

- Study on edge detection algorithms of micro accessory
- Optics and Precision Engineering Vol. 17, Issue 2, Pages: 356-361(2009)
- 作者机构：
  
  北京理工大学机械与车辆工程学院北京理工大学机械与车辆工程学院
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：03 March 2008，
  
  Revised：06 April 2008，
  
  Published Online：25 February 2009，
  
  Published：25 February 2009
- 稿件说明：
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张之敬杜芳. 微小尺寸零件复杂边缘识别算法研究[J]. 光学精密工程, 2009,17(2):356-361

Zhi-jing ZHANG. Study on edge detection algorithms of micro accessory[J]. Optics and precision engineering, 2009, 17(2): 356-361.
张之敬杜芳. 微小尺寸零件复杂边缘识别算法研究[J]. 光学精密工程, 2009,17(2):356-361 DOI：

Zhi-jing ZHANG. Study on edge detection algorithms of micro accessory[J]. Optics and precision engineering, 2009, 17(2): 356-361. DOI：

摘要

目的：为了实现对微小尺寸零件复杂边缘的识别，根据微小尺寸零件加工特性，提出一种微小尺寸零件复杂边缘显微图像识别算法。方法：该算法通过对不同工件的边缘过渡区进行提取，建立不同工件边缘过渡区的数学模型，再从数学模型中根据加工特性确定边缘点精确位置。结果：实验结果表明：精研磨工艺的零级1mm标准量块的测量误差为0.395μm。结论：通过对精研磨、冲压、线切割三种常见微细加工方法建模分析得出：加工特性对微小型结构件边缘区域影响较大，边缘精确识别时应考虑加工特性的影响。该算法思想上考虑了实际加工特性的影响，算法上加入统计学方法，通过建立过渡区数学模型使边缘检测结果达到亚象素级。

Abstract

Objective: In order to realize edge detection for micro accessory

a new edge detecting algorithm of micro accessory is proposed based on the process characteristic of micro accessory. Method: First

this algorithm extracts the transition region of different parts. The polynomial regression mathematics models of transition region in the different parts are built and then the accurate position is got by process character from the mathematics model. Result: Experimental results indicate that the measurement error of 1mm standard gauge block is 0.395μm. Conclusion: It draws that the process characteristic has greater influence for the edge of micro accessory and so the edge detection of micro accessory should consider the influence of process characteristic by the common process methods—lapping

stamping and wire-cutting. The actual processing condition and statistics are added in this algorithm. The edge detection result can reach the inferior pixel level by building the mathematics model of transition region.

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Related Institution

Key Laboratory of Optoelectronic Imaging Technology and System, Ministry of Education, School of Optoelectronics, Beijing Institute of Technology

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北京理工大学化工与环境学院

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