The single-reference resistance ratio temperature measurement system is a commonly used method for high-precision temperature measurement, which can effectively weaken the effect of constant current source long-term drift, amplifier gain drift, thermoelectric potential, and other factors on the measurement results. However, the performance worsens when the value of the measured resistance is far away from the reference resistance. To solve this problem, we analyze the platinum resistance and a single-reference resistance ratio temperature measurement method based on a constant current source, introduce a nonlinear factor, and analyze why the measurement performance will deteriorate as the value of the measured resistance moves far away from the reference resistance. Moreover, based on this, a multi-reference resistance ratio temperature measurement method is proposed and the hardware system is designed. The multi-reference resistance ratio temperature measurement system was tested by performing equivalent experiments to determine the long-term stability, resolution ability, and nonlinear calibration degradation caused by different ambient temperatures, which verifies the correctness of the theoretical derivation part of this study. The experimental results showed that, in the temper
ature measurement range of approximately
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38.8~64.6 ℃, the measurement stability of the high-precision multi-reference resistance ratio temperature measurement system is better than 0.0025 ℃/5 d, the measurement resolution is better than 0.00125 ℃, and the measurement stability at an ambient temperature range of 5 to 45 ℃ is better than 0.004 ℃. It basically meets the long-term temperature measurement application requirements with large environmental temperature changes.
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