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1.Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
2.University of Chinese Academy of Sciences, Beijing 100049, China
3.Key Laboratory of Infrared System Detection and Imaging Technology, Chinese Academy of Sciences, Shanghai 200083, China
Published:15 May 2021,
Received:02 December 2020,
Revised:22 December 2020,
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辛世杰,丁雷.高精度多参考阻值比率测温系统[J].光学精密工程,2021,29(05):1115-1126.
XIN Shi-jie,DING Lei.High-precision multi-reference ratiometric temperature measurement system[J].Optics and Precision Engineering,2021,29(05):1115-1126.
辛世杰,丁雷.高精度多参考阻值比率测温系统[J].光学精密工程,2021,29(05):1115-1126. DOI: 10.37188/OPE.20212905.1115.
XIN Shi-jie,DING Lei.High-precision multi-reference ratiometric temperature measurement system[J].Optics and Precision Engineering,2021,29(05):1115-1126. DOI: 10.37188/OPE.20212905.1115.
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