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Measuring and evaluating system for surface morphology of sapphire substrates
Modern Applied Optics | 更新时间:2022-01-25
    • Measuring and evaluating system for surface morphology of sapphire substrates

    • Optics and Precision Engineering   Vol. 29, Issue 11, Pages: 2556-2566(2021)
    • DOI:10.37188/OPE.20212911.2556    

      CLC: TH742
    • Received:19 April 2021

      Revised:06 May 2021

      Published:15 November 2021

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  • CUI Chang-cai,YANG Cheng,LI Zi-qing,et al.Measuring and evaluating system for surface morphology of sapphire substrates[J].Optics and Precision Engineering,2021,29(11):2556-2566. DOI: 10.37188/OPE.20212911.2556.

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