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1.Shenzhen Angell Technology Co., Ltd., Shenzhen 518000, China
2.School of Physics & Optoelectronic Engineering, Guangdong University of Technology, Guangzhou 510006, China
Published:25 February 2022,
Received:08 July 2021,
Revised:26 July 2021,
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蓝重洲,王宗朋,文敏儒.双层平板探测的双能成像检测系统[J].光学精密工程,2022,30(04):372-379.
LAN Chongzhou,WANG Zongpeng,WEN Minru.Dual energy imaging inspection system using dual layer flat panel detector[J].Optics and Precision Engineering,2022,30(04):372-379.
蓝重洲,王宗朋,文敏儒.双层平板探测的双能成像检测系统[J].光学精密工程,2022,30(04):372-379. DOI: 10.37188/OPE.20223004.0372.
LAN Chongzhou,WANG Zongpeng,WEN Minru.Dual energy imaging inspection system using dual layer flat panel detector[J].Optics and Precision Engineering,2022,30(04):372-379. DOI: 10.37188/OPE.20223004.0372.
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