您当前的位置:
首页 >
文章列表页 >
Dual energy imaging inspection system using dual layer flat panel detector
Modern Applied Optics | 更新时间:2022-02-26
    • Dual energy imaging inspection system using dual layer flat panel detector

    • Optics and Precision Engineering   Vol. 30, Issue 4, Pages: 372-379(2022)
    • DOI:10.37188/OPE.20223004.0372    

      CLC: TH774;TP751.1
    • Received:08 July 2021

      Revised:26 July 2021

      Published:25 February 2022

    移动端阅览

  • LAN Chongzhou,WANG Zongpeng,WEN Minru.Dual energy imaging inspection system using dual layer flat panel detector[J].Optics and Precision Engineering,2022,30(04):372-379. DOI: 10.37188/OPE.20223004.0372.

  •  
  •  

0

Views

819

下载量

0

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Publicity Resources

OPE | Dual energy imaging inspection system using dual layer flat panel detector

Related Articles

Dual energy imaging inspection system using dual layer flat panel detector
Infrared-visible remote sensing image registration method based on Kullback-Leibler divergence using variational approximation
Multispectral image fusion method for surface defect detection of IC devices
Automatic registration of optical and SAR remote sensing image based on phase feature
Infrared-visible video automatic registration with contour feature matching

Related Author

Chong-zhou LAN
Zong-peng WANG
Min-ru WEN
WANG Jia
WU Hao
FU Ruigang
KONG Lingshuang
ZUO Yi

Related Institution

School of Physics & Optoelectronic Engineering, Guangdong University of University
College of Electronic Science and Technology, National University of Defense Technology
Institute of Dataspace, Hefei Comprehensive National Science Center
School of Electronic Information and Electrical Engineering, Changsha University
College of Mechanical and Electrical Engineering, Guangdong University of Technology
0